Simultaneous Double-sided Wafer Deposition via Plasma Enhanced ALD
Report investigating simultaneous dual-surface deposition of AlOx films on silicon wafers using the Plasma Enhanced Atomic Layer Deposition (PEALD) technique.
Report investigating simultaneous dual-surface deposition of AlOx films on silicon wafers using the Plasma Enhanced Atomic Layer Deposition (PEALD) technique.
We are pleased to share that Samco Inc. has been featured in TIME magazine. In the article “Taking a Quantum Leap,” the story traces our journey from a Kyoto garage in the 1970s—where we developed our first PECVD system—to our current role as a global supplier of semiconductor processing equipment. CEO Osamu Tsuji reflects on…
Introduction Plasma-enhanced chemical vapor deposition (PECVD) systems were initially developed for low-temperature film deposition. However, recent diversification in research and development needs has led to a demand for systems capable of high-temperature film deposition. PECVD systems, a cornerstone of Samco, utilize silicon tetrahydride (SiH4) gas for silicon nitride (SiN) and silicon dioxide (SiO2) film deposition.…
Micro- and nanoscale device research, deposition and etching processes using RIE and PECVD for advanced structures.